Memory, Cell Library & IBIS Model, and Lowering Vdd Analysis
1. Compiled Memory Characterization Solutions
- Production and silicon proven over numerous designs
- Execute "on-the-fly" verification for high reliability
2. Customized Memory Characterization Solutions
- User's own stimulus & measures, and Legend-provided critical-path circuits.
- Achieve the best performance, reliability and productivity.
3. Enabling Large-Memory Layout RC Extraction for Characterization
4. Built-in Instance Characterization in Mobile's Memory Compiler
- Provide the exact-size instance .Lib models, in addition to compiler models.
- Enable high-speed characterization, and on-the-fly reliability checking.
5. The Process for Lowering Vdd to Reduce Power
- Lowering Vdd to reduce power consumption is effective and low-cost.
- The analysis for reliability and yields is necessary.
- The layout changes (e.g. increasing driver size) might be needed.
6. Standard Cell Library Model QA & Diagnosis
- Quickly locate the violations of function, timing, power & missing timing arcs.
- Repair the .Lib model to meet the production requirement.
7. Memory CCS Model Characterization Solutions
8. IBIS Model Characterization and Validation Solutions
- SimDE for IBIS model characterization & validation, and MSIM for simulation.
- MSIM fully integrated, and as a default simulator for IBIS model validation.
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